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ICASSP
2011
IEEE
14 years 10 months ago
A paired test for recognizer selection with untranscribed data
Traditionally, the use of untranscribed speech has been restricted to unsupervised or semi-supervised training of acoustic models. Comparison of recognizers has required labeled d...
Bhiksha Raj, Rita Singh, James Baker
DAC
2009
ACM
16 years 7 months ago
Fault models for embedded-DRAM macros
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
Ching-Yu Chin, Hao-Yu Yang, Mango Chia-Tso Chao, R...
ETS
2010
IEEE
174views Hardware» more  ETS 2010»
15 years 7 months ago
Test-architecture optimization for TSV-based 3D stacked ICs
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
Brandon Noia, Sandeep Kumar Goel, Krishnendu Chakr...
OOPSLA
2010
Springer
15 years 5 months ago
Teaching and training developer-testing techniques and tool support
Developer testing is a type of testing where developers test their code as they write it, as opposed to testing done by a separate quality assurance organization. Developer testin...
Tao Xie, Jonathan de Halleux, Nikolai Tillmann, Wo...
ICSE
2007
IEEE-ACM
16 years 6 months ago
Using GUI Run-Time State as Feedback to Generate Test Cases
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
Xun Yuan, Atif M. Memon