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HASE
2002
IEEE
15 years 11 months ago
Extending WSDL to Facilitate Web Services Testing
Web services might be the most popular and powerful software development technology in today’s software world. Yet it brings software developers and tester a lot of challenges a...
Wei-Tek Tsai, Raymond A. Paul, Yamin Wang, Chun Fa...
VTS
1998
IEEE
88views Hardware» more  VTS 1998»
15 years 11 months ago
Transition Maximization Techniques for Enhancing the Two-Pattern Fault Coverage of Pseudorandom Test Pattern Generators
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
Bruce F. Cockburn, Albert L.-C. Kwong
DAC
1994
ACM
15 years 10 months ago
Functional Test Generation for FSMs by Fault Extraction
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
Bapiraju Vinnakota, Jason Andrews
DATE
1997
IEEE
109views Hardware» more  DATE 1997»
15 years 10 months ago
Sequential circuit test generation using dynamic state traversal
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
HIS
2004
15 years 8 months ago
Classification Ensembles for Shaft Test Data: Empirical Evaluation
: A-scans from ultrasonic testing of long shafts are complex signals. The discrimination of different types of echoes is of importance for non-destructive testing and equipment mai...
Kyungmi Lee, Vladimir Estivill-Castro