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AMOST
2005
ACM
16 years 7 days ago
Modeling requirements for combinatorial software testing
The combinatorial approach to software testing uses models to generate a minimal number of test inputs so that selected combinations of input values are covered. The most common c...
Christopher M. Lott, Ashish Jain, Siddhartha R. Da...
FATES
2004
Springer
16 years 2 days ago
Specifying and Generating Test Cases Using Observer Automata
We present a technique for specifying coverage criteria and a method for generating test suites for systems whose behaviours can be described as extended finite state machines (EF...
Johan Blom, Anders Hessel, Bengt Jonsson, Paul Pet...
165
Voted
DATE
2002
IEEE
98views Hardware» more  DATE 2002»
15 years 11 months ago
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
Michael Pronath, Helmut E. Graeb, Kurt Antreich
DAC
1996
ACM
15 years 10 months ago
Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
Laurence Goodby, Alex Orailoglu
DATE
2004
IEEE
131views Hardware» more  DATE 2004»
15 years 10 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty