The combinatorial approach to software testing uses models to generate a minimal number of test inputs so that selected combinations of input values are covered. The most common c...
Christopher M. Lott, Ashish Jain, Siddhartha R. Da...
We present a technique for specifying coverage criteria and a method for generating test suites for systems whose behaviours can be described as extended finite state machines (EF...
Johan Blom, Anders Hessel, Bengt Jonsson, Paul Pet...
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...