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183
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
184
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ISSRE
2002
IEEE
15 years 11 months ago
2002
IEEE
Object-oriented programs cause a shift in focus from software units to the way software classes and components are connected. Thus, we are finding that we need less emphasis on un...
170
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APSEC
2004
IEEE
15 years 10 months ago
2004
IEEE
Domain testing, a technique for testing software or portions of software dominated by numerical processing, is intended to detect domain errors that usually arise from incorrect i...
171
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DATE
2004
IEEE
15 years 10 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
162
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ICECCS
2000
IEEE
15 years 10 months ago
2000
IEEE
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...