10715 search results - page 242 / 2143 » Proofs from Tests |
184
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ETS
2006
IEEE
16 years 22 days ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
172
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GECCO
2005
Springer
16 years 5 days ago
2005
Springer
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
201
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SEKE
2005
Springer
16 years 4 days ago
2005
Springer
This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
183
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DATE
2003
IEEE
15 years 12 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
141
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...