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163
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
206
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ACMSE
2006
ACM
16 years 19 days ago
2006
ACM
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...
178
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ICECCS
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
192
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EURODAC
1995
IEEE
15 years 10 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
180
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CSDA
2007
15 years 6 months ago
2007
Partial F tests play a central role in model selections in multiple linear regression models. This paper studies the partial F tests from the view point of simultaneous confidence...