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194
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GI
2007
Springer
16 years 24 days ago
2007
Springer
: In this article we advocate an integrated approach for the automation of module or software integration testing and static analysis. It is illustrated how funmethods of static an...
156
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ISVC
2007
Springer
16 years 24 days ago
2007
Springer
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
150
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DATE
2006
IEEE
16 years 21 days ago
2006
IEEE
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
133
Voted
ISSTA
2006
ACM
16 years 18 days ago
2006
ACM
This paper extends basic software-testing theory to software components and adds explicit state to the theory. The resulting theory e enough to abstractly model the construction o...
182
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DATE
2005
IEEE
16 years 8 days ago
2005
IEEE
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...