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ITC
2003
IEEE
126views Hardware» more  ITC 2003»
15 years 12 months ago
Convolutional Compaction of Test Responses
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...
Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M...
ICALP
2010
Springer
15 years 10 months ago
Testing 2-Vertex Connectivity and Computing Pairs of Vertex-Disjoint s-t Paths in Digraphs
We present an O(m + n)-time algorithm that tests if a given directed graph is 2-vertex connected, where m is the number of arcs and n is the number of vertices. Based on this resul...
Loukas Georgiadis
ATAL
2008
Springer
15 years 8 months ago
Automated unit testing intelligent agents in PDT
The Prometheus Design Tool (PDT) is an agent development tool that supports the Prometheus design methodology and includes features like automated code generation. We enhance this...
Zhiyong Zhang, John Thangarajah, Lin Padgham
IPCV
2008
15 years 8 months ago
Test and Measure of Circularity for Digital Curves
We propose one geometric algorithm to solve both the problem of circularity test and the problem of circularity measure. The former problem consists in deciding whether a given di...
Tristan Roussillon, Isabelle Sivignon, Laure Tougn...
ACL
2010
15 years 4 months ago
Grammar Prototyping and Testing with the LinGO Grammar Matrix Customization System
This demonstration presents the LinGO Grammar Matrix grammar customization system: a repository of distilled linguistic knowledge and a web-based service which elicits a typologic...
Emily M. Bender, Scott Drellishak, Antske Fokkens,...