6274 search results - page 305 / 1255 » Proofs, Programs, Processes |
171
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ESOP
2010
Springer
16 years 4 months ago
2010
Springer
We develop a generic framework for the analysis of programs with recursive procedures and dynamic process creation. To this end we combine the approach of weighted pushdown systems...
151
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ICIP
2003
IEEE
16 years 8 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
208
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ICIP
2001
IEEE
16 years 8 months ago
2001
IEEE
A common problem in most active contour methods is that the recursive searching scheme can only return a local optimal solution. Furthermore, the internal energy of the snake is n...
154
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ICSE
2009
IEEE-ACM
16 years 1 months ago
2009
IEEE-ACM
Model checking finds failures in software by exploring every possible execution schedule. Until recently it has been mainly applied to stand-alone applications. This paper presen...
177
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ICASSP
2009
IEEE
16 years 1 months ago
2009
IEEE
The problem of node localization in a wireless sensor network (WSN) with the use of the incomplete and noisy distance measurements between nodes as well as anchor position informa...