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184
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AINA
2007
IEEE
16 years 1 months ago
2007
IEEE
Continuous improvements in integration scale have made major microprocessor vendors to move to designs that integrate several processor cores on the same chip. Chip-multiprocessor...
244
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CLUSTER
2007
IEEE
16 years 1 months ago
2007
IEEE
— One of the most useful features provided by virtual machine (VM) technologies is the ability to migrate running OS instances across distinct physical nodes. As a basis for many...
172
Voted
COMSWARE
2007
IEEE
16 years 1 months ago
2007
IEEE
— We share our experience in planning, designing and deploying a wireless sensor network of one square kilometre area. Environmental data such as soil moisture, temperature, baro...
170
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DDECS
2007
IEEE
16 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
143
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ECBS
2007
IEEE
16 years 1 months ago
2007
IEEE
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can ...