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ITC
2003
IEEE
158views Hardware» more  ITC 2003»
15 years 11 months ago
Extraction Error Diagnosis and Correction in High-Performance Designs
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
IWPSE
2003
IEEE
15 years 11 months ago
Lightweight Prevention of Architectural Erosion
Avoiding architectural erosion helps extend the lifetime of an evolving software system. Erosion can be reduced by ensuring that (i) developers share a good understanding of a sys...
Ciaran O'Reilly, Philip J. Morrow, David W. Bustar...
CTRSA
2003
Springer
120views Cryptology» more  CTRSA 2003»
15 years 11 months ago
Simple Backdoors for RSA Key Generation
We present extremely simple ways of embedding a backdoor in the key generation scheme of RSA. Three of our schemes generate two genuinely random primes p and q of a given size, to...
Claude Crépeau, Alain Slakmon
COMPSAC
2002
IEEE
15 years 11 months ago
A Unified Process Support Framework for Global Software Development
There is an increasing trend in global software development, where different parts of a software product are being developed in different organisations. The process aspect of such...
Jin Sa, Elena Maslova
ICTAI
2002
IEEE
15 years 11 months ago
Updating a Hybrid Rule Base with New Empirical Source Knowledge
Neurules are a kind of hybrid rules that combine a symbolic (production rules) and a connectionist (adaline unit) representation. Each neurule is represented as an adaline unit. O...
Jim Prentzas, Ioannis Hatzilygeroudis, Athanasios ...