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DATE
2003
IEEE
116views Hardware» more  DATE 2003»
15 years 11 months ago
Statistical Timing Analysis Using Bounds
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
Aseem Agarwal, David Blaauw, Vladimir Zolotov, Sar...
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
15 years 11 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
DSN
2003
IEEE
15 years 11 months ago
Comparison of Failure Detectors and Group Membership: Performance Study of Two Atomic Broadcast Algorithms
Protocols that solve agreement problems are essential building blocks for fault tolerant distributed systems. While many protocols have been published, little has been done to ana...
Péter Urbán, Ilya Shnayderman, Andr&...
ECRTS
2003
IEEE
15 years 11 months ago
A Real-Time RMI Framework for the RTSJ
The Real-Time Specification for Java (RTSJ) provides a platform for the development of real-time applications. However, the RTSJ does not take the distribution requirements of re...
Andrew Borg, Andy J. Wellings
ISSRE
2003
IEEE
15 years 11 months ago
Exploiting Symmetries to Test Programs
Symmetries often appear as properties of many artifical settings. In Program Testing, they can be viewed as properties of programs and can be given by the tester to check the cor...
Arnaud Gotlieb