6819 search results - page 953 / 1364 » Process Reuse Architecture |
134
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VLSID
2005
IEEE
16 years 7 months ago
2005
IEEE
In this paper, we have studied and compared the RF performance metrics, unity gain frequency (ft) and Noise Figure (NF), of the devices with channel engineering consisting of halo...
171
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VLSID
2005
IEEE
16 years 7 months ago
2005
IEEE
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
158
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
Dynamic noise analysis is greatly needed in place of traditional static noise analysis due to the ever increasingly stringent design requirement for VLSI chips based on very deep ...
166
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
This paper combines an adaptive supply-voltage scheme with self-timed CMOS digital design, to achieve low power performance. The supply-voltage automatically tracks the input data...
172
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Functional decomposition is a process of splitting a complex circuit into smaller sub-circuits. This paper deals with the problem of determining the set of best free and bound var...