6819 search results - page 1140 / 1364 » Process Reuse Architecture |
156
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
125
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
145
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
This paper presents a parameterized soft core generator for the discrete Fourier transform (DFT). Reusable IPs of digital signal processing (DSP) kernels are important time-saving...
151
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
We present an efficient search strategy for satisfiability checking on circuits represented at the register-transfer-level (RTL). We use the RTL circuit structure by extending con...
144
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Partitioned BDD-based algorithms have been proposed in the literature to solve the memory explosion problem in BDD-based verification. Such algorithms can be at times ineffective ...