7554 search results - page 1342 / 1511 » Process Diagnostics: A Method Based on Process Mining |
167
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IROS
2007
IEEE
16 years 21 days ago
2007
IEEE
— In this paper, we present an approach that applies the reinforcement learning principle to the problem of learning height control policies for aerial blimps. In contrast to pre...
195
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IROS
2007
IEEE
16 years 21 days ago
2007
IEEE
— When the tasks of a mission are interrelated and subject to several resource constraints, more efforts are needed to coordinate robots towards achieving the mission than indepe...
174
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ISBI
2007
IEEE
16 years 21 days ago
2007
IEEE
This contribution describes a system and method for tomographically imaging lymph nodes marked with a lymph endothelium targeting fluorescence reporter. A novel scanning NIR lase...
160
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ISVLSI
2007
IEEE
16 years 20 days ago
2007
IEEE
— Chemical-Mechanical Polishing (CMP) is one of the key steps during nanometer VLSI manufacturing process where minimum variation of layout pattern densities is desired. This pap...
186
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VTC
2007
IEEE
16 years 20 days ago
2007
IEEE
—To approximate the exact peaks of continuous-time orthogonal frequency division multiplexing (OFDM) signals, four times oversampling is usually employed for discrete-time OFDM s...