7554 search results - page 1037 / 1511 » Process Diagnostics: A Method Based on Process Mining |
162
click to vote
ISQED
2002
IEEE
15 years 12 months ago
2002
IEEE
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
169
click to vote
FPL
2009
Springer
15 years 11 months ago
2009
Springer
A silicon Physical Unclonable Function (PUF), which is a die-unique challenge-response function, is an emerging hardware primitive for secure applications. It exploits manufacturi...
195
click to vote
LSSC
2001
Springer
15 years 11 months ago
2001
Springer
The problen of the backscattering of electrons from metal targets is subject of extensive theoreticel and experimental work in surface analysis. We are interested in the angular di...
139
click to vote
ICRA
2000
IEEE
15 years 11 months ago
2000
IEEE
Manipulative operations of rheological objects can befound in many industrial fields such as food industry and medical product industry. Automatic operations of rheological object...
141
click to vote
ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...