8808 search results - page 1411 / 1762 » Process Change Patterns |
267
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ICDE
2005
IEEE
16 years 8 months ago
2005
IEEE
We consider the problem of efficiently computing the skyline against the most recent N elements in a data stream seen so far. Specifically, we study the n-of-N skyline queries; th...
195
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
163
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MICCAI
2003
Springer
16 years 7 months ago
2003
Springer
Abstract. This paper describes effort towards automatic tissue segmentation in neonatal MRI. Extremely low contrast to noise ratio (CNR), regional intensity changes due to RF coil ...
188
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SIGSOFT
2009
ACM
16 years 7 months ago
2009
ACM
Debugging refers to the laborious process of finding causes of program failures. Often, such failures are introduced when a program undergoes changes and evolves from a stable ver...
268
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WWW
2008
ACM
16 years 7 months ago
2008
ACM
We discover communities from social network data, and analyze the community evolution. These communities are inherent characteristics of human interaction in online social network...