8808 search results - page 1347 / 1762 » Process Change Patterns |
209
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INFOVIS
2003
IEEE
16 years 2 days ago
2003
IEEE
Large numbers of dimensions not only cause clutter in multidimensional visualizations, but also make it difficult for users to navigate the data space. Effective dimension manage...
153
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ISCAS
2003
IEEE
16 years 2 days ago
2003
IEEE
In this paper, a robust and efficient digital image watermarking algorithm using the fast Hadamard transform (FHT) is proposed for the copyright protection of digital images. This...
150
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ISQED
2003
IEEE
16 years 2 days ago
2003
IEEE
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-...
141
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ITC
2003
IEEE
16 years 2 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
218
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SBACPAD
2003
IEEE
16 years 1 days ago
2003
IEEE
Frequent itemset mining is a classic problem in data mining. It is a non-supervised process which concerns in finding frequent patterns (or itemsets) hidden in large volumes of d...