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SISAP
2008
IEEE
115views Data Mining» more  SISAP 2008»
16 years 1 months ago
A Dynamic Pivot Selection Technique for Similarity Search
All pivot-based algorithms for similarity search use a set of reference points called pivots. The pivot-based search algorithm precomputes some distances to these reference points...
Benjamin Bustos, Oscar Pedreira, Nieves R. Brisabo...
SMI
2008
IEEE
118views Image Analysis» more  SMI 2008»
16 years 1 months ago
A least-norm approach to flattenable mesh surface processing
Following the definition of developable surface in differential geometry, the flattenable mesh surface, a special type of piecewiselinear surface, inherits the good property of ...
Charlie C. L. Wang
SUTC
2008
IEEE
16 years 1 months ago
Security Enforcement Model for Distributed Usage Control
Recently proposed usage control concept and models extend traditional access control models with features for contemporary distributed computing systems, including continuous acce...
Xinwen Zhang, Jean-Pierre Seifert, Ravi S. Sandhu
VTC
2008
IEEE
185views Communications» more  VTC 2008»
16 years 1 months ago
Opportunistic Spectrum Access for Energy-Constrained Cognitive Radios
This paper considers a scenario in which a secondary user makes opportunistic use of a channel allocated to some primary network. The primary network operates in a time-slotted ma...
Anh Tuan Hoang, Ying-Chang Liang, David Tung Chong...
VTS
2008
IEEE
77views Hardware» more  VTS 2008»
16 years 1 months ago
Test-Pattern Ordering for Wafer-Level Test-During-Burn-In
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty
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