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WSC
1998
15 years 7 months ago
A Rapid Modeling Technique for Measurable Improvements in Factory Performance
This paper discusses a methodology for quickly investigating problem areas in semiconductor wafer fabrication factories by creating a model for the production area of interest onl...
Andreas Peikert, Josef Thoma, Steven Brown
COMPUTER
2008
51views more  COMPUTER 2008»
15 years 6 months ago
Measuring Multicore Performance
Shay Gal-On, Markus Levy
CSE
2008
IEEE
15 years 6 months ago
Measuring High-Performance Computing with Real Applications
Mohamed Sayeed, Hansang Bae, Yili Zheng, Brian Arm...
CONCURRENCY
2006
91views more  CONCURRENCY 2006»
15 years 6 months ago
Measuring and modelling the performance of a parallel ODMG compliant object database server
Sandra de F. Mendes Sampaio, Norman W. Paton, Jim ...
CII
2007
39views more  CII 2007»
15 years 6 months ago
Performance measurement
Paul Valckenaers