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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
SIGMETRICS
2005
ACM
120views Hardware» more  SIGMETRICS 2005»
15 years 12 months ago
Automatic measurement of memory hierarchy parameters
The running time of many applications is dominated by the cost of memory operations. To optimize such applications for a given platform, it is necessary to have a detailed knowled...
Kamen Yotov, Keshav Pingali, Paul Stodghill
SIGMETRICS
2003
ACM
115views Hardware» more  SIGMETRICS 2003»
15 years 11 months ago
Measuring the effects of internet path faults on reactive routing
Empirical evidence suggests that reactive routing systems improve resilience to Internet path failures. They detect and route around faulty paths based on measurements of path per...
Nick Feamster, David G. Andersen, Hari Balakrishna...
BMCBI
2008
142views more  BMCBI 2008»
15 years 6 months ago
Strategies for measuring evolutionary conservation of RNA secondary structures
Background: Evolutionary conservation of RNA secondary structure is a typical feature of many functional non-coding RNAs. Since almost all of the available methods used for predic...
Andreas R. Gruber, Stephan H. F. Bernhart, Ivo L. ...
BMCBI
2006
130views more  BMCBI 2006»
15 years 6 months ago
CARMA: A platform for analyzing microarray datasets that incorporate replicate measures
Background: The incorporation of statistical models that account for experimental variability provides a necessary framework for the interpretation of microarray data. A robust ex...
Kevin A. Greer, Matthew R. McReynolds, Heddwen L. ...