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ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
16 years 1 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
WINE
2007
Springer
124views Economy» more  WINE 2007»
16 years 1 months ago
Stochastic Models for Budget Optimization in Search-Based Advertising
Internet search companies sell advertisement slots based on users’ search queries via an auction. Advertisers have to solve a complex optimization problem of how to place bids o...
S. Muthukrishnan, Martin Pál, Zoya Svitkina
IISWC
2006
IEEE
16 years 1 months ago
Constructing a Non-Linear Model with Neural Networks for Workload Characterization
Workload characterization involves the understanding of the relationship between workload configurations and performance characteristics. To better assess the complexity of worklo...
Richard M. Yoo, Han Lee, Kingsum Chow, Hsien-Hsin ...
SAMOS
2005
Springer
16 years 19 days ago
Modeling NoC Architectures by Means of Deterministic and Stochastic Petri Nets
The design of appropriate communication architectures for complex Systems-on-Chip (SoC) is a challenging task. One promising alternative to solve these problems are Networks-on-Chi...
Holger Blume, Thorsten von Sydow, Daniel Becker, T...
HICSS
2003
IEEE
105views Biometrics» more  HICSS 2003»
16 years 14 days ago
Does the Extended Technology Acceptance Model Apply to Physicians
In previous studies, the technology acceptance model (TAM) [1] has been widely used by information technology researchers to gain a better understanding of information technology ...
William G. Chismar, Sonja Wiley-Patton