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DAC
2008
ACM
16 years 8 months ago
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
DAC
2007
ACM
16 years 8 months ago
Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Qunzeng Liu, Sachin S. Sapatnekar
DAC
2000
ACM
16 years 8 months ago
Predicting performance potential of modern DSPs
Naji Ghazal, A. Richard Newton, Jan M. Rabaey
MICCAI
2004
Springer
16 years 8 months ago
Predicting Tumour Location by Simulating Large Deformations of the Breast Using a 3D Finite Element Model and Nonlinear Elastici
Two of the major imaging modalities used to detect and monitor breast cancer are (contrast enhanced) magnetic resonance (MR) imaging and mammography. Image fusion, including accura...
Pras Pathmanathan, David Gavaghan, Jonathan Whitel...