12943 search results - page 2005 / 2589 » Predicting When Not to Predict |
187
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SECON
2008
IEEE
16 years 1 months ago
2008
IEEE
—In this paper, we present Black Burst Synchronization (BBS)1 , a novel protocol for decentralized network-wide tick synchronization in wireless ad hoc networks, located at MAC l...
228
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SRDS
2008
IEEE
16 years 1 months ago
2008
IEEE
Large-scale distributed systems are subject to churn, i.e., continuous arrival, departure and failure of processes. Analysis of protocols under churn requires one to use churn mod...
184
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VTC
2008
IEEE
16 years 1 months ago
2008
IEEE
— This paper proposes a low-complexity model for vertical antenna radiation patterns, e.g. for inclusion in systemlevel simulations. They can be seen as extensions to the horizon...
187
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
156
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...