3819 search results - page 421 / 764 » Predicting Dependability by Testing |
163
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VLSID
1999
IEEE
15 years 11 months ago
1999
IEEE
To minimize the time to market and cost of new sub 0.25um process technologies and products, PDF Solutions, Inc., has developed a new comprehensive approach based on the use of pr...
158
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ICCAD
1998
IEEE
15 years 11 months ago
1998
IEEE
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...
176
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KDD
1999
ACM
15 years 11 months ago
1999
ACM
Tree Augmented Naive Bayes (TAN) has shown to be competitive with state-of-the-art machine learning algorithms [3]. However, the TAN induction algorithm that appears in [3] can be...
167
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AUSAI
2006
Springer
15 years 10 months ago
2006
Springer
Attribute subsetting is a meta-classification technique, based on learning multiple base-level classifiers on projections of the training data. In prior work with nearest-neighbour...
196
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FGR
2006
IEEE
15 years 10 months ago
2006
IEEE
We address the task of accurately localizing the eyes in face images extracted by a face detector, an important problem to be solved because of the negative effect of poor localiz...