1419 search results - page 23 / 284 » Power Droop Testing |
151
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VTS
2005
IEEE
15 years 11 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
144
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ISQED
2003
IEEE
15 years 11 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
158
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SC
1994
ACM
15 years 10 months ago
1994
ACM
Most current data dependence tests cannot handle loop bounds or array subscripts that are symbolic, nonlinear expressions e.g. Ani+j, where 0 j n. In this paper, we describe a d...
130
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SOCC
2008
IEEE
16 years 8 days ago
2008
IEEE
An in-situ self-aware adaptive power control (APC) system is presented in this paper. This APC system consists of a voltage sensor, a variable threshold comparator, slack detectio...
145
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ATS
2005
IEEE
15 years 11 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...