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ATS
2010
IEEE
239views Hardware» more  ATS 2010»
15 years 1 months ago
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at...
Michael A. Kochte, Christian G. Zoellin, Rafal Bar...
TASE
2010
IEEE
15 years 1 months ago
Intelligent Component-Based Automation of Baggage Handling Systems With IEC 61499
Airport Baggage Handling is a field of automation systems that is currently dependent on centralised control systems and conventional automation programming techniques. In this and...
Geoff Black, Valeriy Vyatkin
BIRTHDAY
2012
Springer
14 years 2 months ago
Masking with Randomized Look Up Tables - Towards Preventing Side-Channel Attacks of All Orders
We propose a new countermeasure to protect block ciphers implemented in leaking devices, at the intersection between One-Time Programs and Boolean masking schemes. First, we show t...
François-Xavier Standaert, Christophe Petit...
HPCA
2006
IEEE
16 years 7 months ago
BulletProof: a defect-tolerant CMP switch architecture
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
15 years 11 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi