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KBSE
2005
IEEE
16 years 3 hour ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
MSS
2005
IEEE
62views Hardware» more  MSS 2005»
16 years 1 hour ago
Predictive Reduction of Power and Latency (PuRPLe)
Increasing efforts have been aimed towards the management of power as a critical system resource, and the disk can consume approximately a third of the power required for a typica...
Matthew Craven, Ahmed Amer
RTAS
2005
IEEE
16 years 42 min ago
Feedback-Based Dynamic Voltage and Frequency Scaling for Memory-Bound Real-Time Applications
Dynamic voltage and frequency scaling is increasingly being used to reduce the energy requirements of embedded and real-time applications by exploiting idle CPU resources, while s...
Christian Poellabauer, Leo Singleton, Karsten Schw...
RTSS
2005
IEEE
16 years 28 min ago
Enhanced EDF Scheduling Algorithms for Orchestrating Network-Wide Active Measurements
Monitoring network status such as end-to-end delay, jitter, and available bandwidth is important to support QoS-sensitive applications and timely detection of network anomalies li...
Prasad Calyam, Chang-Gun Lee, Phani Kumar Arava, D...
RTSS
2005
IEEE
16 years 26 min ago
Gradient-Ascending Routing via Footprints in Wireless Sensor Networks
A novel gradient-ascending stateless routing protocol, called GRASP (GRadient Ascending Stateless Protocol), is proposed for stationary wireless sensor networks. GRASP is built wi...
Jai-Jin Lim, Kang G. Shin
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