We formulate and evaluate distribution-free statistical process control (SPC) charts for monitoring an autocorrelated process when a training data set is used to estimate the marg...
Joongsup Lee, Christos Alexopoulos, David Goldsman...
A critical aspect of semiconductor manufacturing is the design and analysis of material handling and production control polices to optimize fab performance. As wafer sizes have in...
In previous work a DOCSIS model was added to ‘ns’ to allow simulations to be run to analyze the performance of DOCSIS. These simulations showed that congestion caused by the a...
Physics-based simulation codes are widely used in science and engineering to model complex systems that would be infeasible to study otherwise. Such codes provide the highest-fid...
A model was introduced in [Fraga97] for integrating replication techniques in heterogeneous systems. The model adopts a reflective structure based on the meta-object approach [10]...
Lau Cheuk Lung, Joni da Silva Fraga, Carlos Mazier...