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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
16 years 1 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
DATE
2009
IEEE
151views Hardware» more  DATE 2009»
16 years 1 months ago
Combined system synthesis and communication architecture exploration for MPSoCs
In this paper, a novel design space exploration approach is proposed that enables a concurrent optimization of the topology, the process binding, and the communication routing of ...
Martin Lukasiewycz, Martin Streubühr, Michael...
ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
15 years 10 months ago
Control-Flow Aware Communication and Conflict Analysis of Parallel Processes
In this paper, we present an approach for control-flow aware communication and conflict analysis of systems of parallel communicating processes. This approach allows to determine ...
Axel Siebenborn, Alexander Viehl, Oliver Bringmann...
IPSN
2007
Springer
16 years 26 days ago
Object tracking in the presence of occlusions via a camera network
This paper describes a sensor network approach to tracking a single object in the presence of static and moving occluders using a network of cameras. To conserve communication ban...
Ali Ozer Ercan, Abbas El Gamal, Leonidas J. Guibas
ISBI
2006
IEEE
16 years 7 months ago
Assessing the accuracy of non-rigid registration with and without ground truth
We compare two methods for assessing the performance of groupwise non-rigid registration algorithms. One approach, which has been described previously, utilizes a measure of overl...
Roy Schestowitz, Carole J. Twining, Timothy F. Coo...