Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
— This paper focuses on the problem of rostering in intermittently connected passive RFID networks. It aims to report a list of tagged mobile nodes that appear in given intereste...
Abstract—This paper describes and compares alternative architectures for achieving the functional goals of name oriented networking. The CCN (content-centric network) scheme prop...
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...