5799 search results - page 551 / 1160 » Patterns Generate Architectures |
201
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ATS
2003
IEEE
16 years 22 days ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
165
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DATE
2003
IEEE
16 years 21 days ago
2003
IEEE
We propose a new approach to accelerate transaction level verification by raising the productivity of the verification suites including test patterns, protocol checker, and simula...
190
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MEMOCODE
2003
IEEE
16 years 21 days ago
2003
IEEE
Several efficient compilation techniques have been recently proposed for the generation of sequential (C) code from Esterel programs. Consisting essentially in direct simulation ...
191
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ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
219
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RSP
1998
IEEE
15 years 11 months ago
1998
IEEE
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...