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    SAC
    2004
    ACM
    108views Applied Computing» more  SAC 2004»
    SQL based frequent pattern mining without candidate generation
    15 years 11 months ago
    SQL based frequent pattern mining without candidate generation
    Download  wwwiti.cs.uni-magdeburg.de
    Xuequn Shang, Kai-Uwe Sattler, Ingolf Geist
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    DATE
    2003
    IEEE
    62views Hardware» more  DATE 2003»
    RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
    15 years 11 months ago
    RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
    Download  www.date-conference.com
    Marcelino B. Santos, José M. Fernandes, Isa...
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    ATS
    2000
    IEEE
    86views Hardware» more  ATS 2000»
    An adjacency-based test pattern generator for low power BIST design
    15 years 10 months ago
    An adjacency-based test pattern generator for low power BIST design
    Download  dit.upc.es
    Patrick Girard, Loïs Guiller, Christian Landr...
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    APSEC
    1999
    IEEE
    105views Software Engineering» more  APSEC 1999»
    A Source Code Generation Support System Using Design Pattern Documents Based on SGML
    15 years 10 months ago
    A Source Code Generation Support System Using Design Pattern Documents Based on SGML
    Download  www.scarpaz.com
    Mika Ohtsuki, Akifumi Makinouchi, Norihiko Yoshida
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    ATS
    1998
    IEEE
    106views Hardware» more  ATS 1998»
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
    15 years 10 months ago
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
    Download  www.cad.polito.it
    This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
    Silvia Chiusano, Fulvio Corno, Paolo Prinetto
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