5799 search results - page 546 / 1160 » Patterns Generate Architectures |
182
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TCAD
2002
15 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
196
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ICSE
2010
IEEE-ACM
15 years 6 months ago
2010
IEEE-ACM
Integrating several legacy software systems together is commonly performed with multiple applications of the Adapter Design Pattern in oo languages such as Java. The integration i...
236
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MICCAI
2010
Springer
15 years 5 months ago
2010
Springer
The paper proposes a new shape morphometry approach to combine advanced classification techniques with geometric features in order to identify morphological abnormalities on brain...
257
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SSPR
2010
Springer
15 years 5 months ago
2010
Springer
Mixture models have been widely used for data clustering. However, commonly used mixture models are generally of a parametric form (e.g., mixture of Gaussian distributions or GMM),...
158
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TCAD
2010
15 years 2 months ago
2010
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to...