5799 search results - page 453 / 1160 » Patterns Generate Architectures |
220
click to vote
AUTOID
2005
IEEE
16 years 13 days ago
2005
IEEE
In this paper, we outline a framework for appropriate and proper usage of simulated data for biometric authentication. Currently, there are no formal guidelines concerning the use...
175
Voted
ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
190
Voted
ISCAS
1993
IEEE
15 years 11 months ago
1993
IEEE
: In this study, we propose two types of coupled oscillators networks and investigate their steady states. One network has two-dimensional honeycomb structure. The other network ha...
177
click to vote
DFT
2004
IEEE
15 years 10 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
174
click to vote
GECCO
2006
Springer
15 years 10 months ago
2006
Springer
In this paper an evolutionary algorithm is used for evolving gaits in a walking biped robot controller. The focus is fast learning in a real-time environment. An incremental appro...