3895 search results - page 479 / 779 » Parametric Feature Detection |
210
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ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
175
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VTS
2005
IEEE
16 years 9 days ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
173
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FBIT
2007
IEEE
15 years 10 months ago
2007
IEEE
In this pilot study, we developed a set of computer vision based surface segmentation and statistical shape analysis algorithms to study genetic influences on brain structure in a...
183
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BMCBI
2010
15 years 6 months ago
2010
Background: High-throughput screens comparing growth rates of arrays of distinct micro-organism cultures on solid agar are useful, rapid methods of quantifying genetic interaction...
180
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BMCBI
2010
15 years 6 months ago
2010
Background: Understanding the genetic basis of disease risk in depth requires an exhaustive knowledge of the types of genetic variation. Very recently, Copy Number Variants (CNVs)...