Abstract— In this paper, the architectural parameters optimization of a three-prismatic-universal-universal (3-PUU) parallel kinematic machine (PKM) with three translational degr...
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
— We evolve a neural network controller for a boat that learns to maintain a given bearing and range with respect to a moving target in the Lagoon 3D game environment. Simulating...
Nathan A. Penrod, David Carr, Sushil J. Louis, Bob...
In this paper, we address the problem of the efficient exploration of the architectural design space for parameterized systems. Since the design space is multi-objective, our aim ...
Gianluca Palermo, Cristina Silvano, S. Valsecchi, ...