In this paper, we present a system including a novel component called programmable aperture and two associated post-processing algorithms for high-quality light field acquisition...
An important aspect of spectral image analysis is identification of materials present in the object or scene being imaged. Enabling technologies include image enhancement, segment...
Fang Li, Michael K. Ng, Robert J. Plemmons, Sudhak...
A plethora of reaching techniques, intended for moving objects between locations distant to the user, have recently been proposed and tested. One of the most promising techniques i...
In this paper, multiple orders per job type formation and release strategies are described for semiconductor wafer fabrication facilities (wafer fabs). Different orders are groupe...
Jens Zimmermann, Scott J. Mason, John W. Fowler, L...
Cluster or chamber tools are often used in the semiconductor industry. In a research environment, moving to smaller device dimensions requires experimentation with new chamber typ...