3791 search results - page 326 / 759 » Packing sets of patterns |
184
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ESTIMEDIA
2006
Springer
15 years 10 months ago
2006
Springer
Nowadays, key characteristics of a processor's instruction set are only exploited in high-level languages by using inline assembly or compiler intrinsics. Inserting intrinsic...
173
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
187
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CIARP
2009
Springer
15 years 10 months ago
2009
Springer
A large number of computer tasks can be modeled as the search for an object near a given query. From multimedia databases to learning algorithms, data mining and pattern recognitio...
191
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ANNPR
2008
Springer
15 years 8 months ago
2008
Springer
Abstract. Automatic pattern classifiers that allow for on-line incremental learning can adapt internal class models efficiently in response to new information without retraining fr...
181
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MCS
2010
Springer
15 years 8 months ago
2010
Springer
Abstract. Although widely used to reduce error rates of difficult pattern recognition problems, multiple classifier systems are not in widespread use in off-line signature verifica...