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156
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ISQED
2009
IEEE
16 years 1 months ago
2009
IEEE
Modern CMOS manufacturing processes have significant variability, which necessitates guard banding to achieve reasonable yield. It is our thesis that variability should be addres...
161
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract—Supply voltage fluctuations that result from inductive noise are increasingly troublesome in modern microprocessors. A voltage “emergency”, i.e., a swing beyond tol...
180
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RTSS
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper presents a quantification of the timing effects that advanced processor features like data and instruction cache, pipelines, branch prediction units and out-oforder ex...
155
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
Increasing dynamic variability with technology scaling has made it essential to incorporate large design-time timing margins to ensure yield and reliable operation. Online techniq...
160
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FCCM
1999
IEEE
15 years 11 months ago
1999
IEEE
Technology scaling of CMOS processes brings relatively faster transistors (gates) and slower interconnects (wires), making viable the addition of reconfigurability to increase per...