In double patterning lithography (DPL), coloring conflict and stitch minimization are the two main challenges. Post layout decomposition algorithm [1] [2]may not be enough to achi...
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
In this paper, we present DeFer -- a fast, high-quality and nonstochastic fixed-outline floorplanning algorithm. DeFer generates a non-slicing floorplan by compacting a slicing fl...
Abstract-- In nanometer-scale VLSI technologies, several interconnect issues like routing congestion and interconnect delay have become the main concerns in placement. However, all...
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...