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DAC
2009
ACM
16 years 8 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
16 years 8 months ago
Dynamic thermal management via architectural adaptation
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...
Ramkumar Jayaseelan, Tulika Mitra
DAC
2009
ACM
16 years 8 months ago
Handling complexities in modern large-scale mixed-size placement
In this paper, we propose an effective algorithm flow to handle largescale mixed-size placement. The basic idea is to use floorplanning to guide the placement of objects at the gl...
Jackey Z. Yan, Natarajan Viswanathan, Chris Chu
DAC
2009
ACM
16 years 8 months ago
ILP-based pin-count aware design methodology for microfluidic biochips
Digital microfluidic biochips have emerged as a popular alternative for laboratory experiments. To make the biochip feasible for practical applications, pin-count reduction is a k...
Cliff Chiung-Yu Lin, Yao-Wen Chang
DAC
2009
ACM
16 years 8 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
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