7303 search results - page 1180 / 1461 » Optimality for dynamic patterns |
176
click to vote
FSTTCS
2000
Springer
15 years 10 months ago
2000
Springer
In this paper we investigate some properties and algorithms related to a text sparsification technique based on the identification of local maxima in the given string. As the numb...
185
click to vote
HIPC
2000
Springer
15 years 10 months ago
2000
Springer
Embedded systems consisting of the application program ROM, RAM, the embedded processor core and any custom hardware on a single wafer are becoming increasingly common in areas suc...
176
click to vote
ICES
2000
Springer
15 years 10 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
163
click to vote
SIGGRAPH
1987
ACM
15 years 10 months ago
1987
ACM
Ray tracing produces point samples of an image from a 3-D model. Constructing an antialiased digital picture from point samples is difficult without resorting to extremely high sa...
178
click to vote
DAC
2010
ACM
15 years 10 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...