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197
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ATS
2005
IEEE
16 years 9 days ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
167
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ICCVW
1999
Springer
15 years 11 months ago
1999
Springer
The parameters estimated by Structure from Motion SFM contain inherent indeterminacies which we call gauge freedoms. Under a perspective camera, shape and motion parameters are o...
160
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ICRA
1998
IEEE
15 years 11 months ago
1998
IEEE
Good robot performance often relies upon the selection of design parameters that lead to a well conditioned Jacobian or impedance "design" matrix. In this paper, a new d...
200
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DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
1 Fault-tolerance is due to the semiconductor technology development important, not only for safety-critical systems but also for general-purpose (non-safety critical) systems. How...
144
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AIED
2007
Springer
15 years 10 months ago
2007
Springer
Complex student models often include key parameters critical to their behavior and effectiveness. For example, one meta-cognitive model of student help-seeking in intelligent tutor...