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ICES
2000
Springer
140views Hardware» more  ICES 2000»
15 years 10 months ago
Evolving Cellular Automata for Self-Testing Hardware
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
BMCBI
2006
146views more  BMCBI 2006»
15 years 6 months ago
Optimized Particle Swarm Optimization (OPSO) and its application to artificial neural network training
Background: Particle Swarm Optimization (PSO) is an established method for parameter optimization. It represents a population-based adaptive optimization technique that is influen...
Michael Meissner, Michael Schmuker, Gisbert Schnei...
BMVC
2002
15 years 9 months ago
Randomized RANSAC with T(d, d) test
Many computer vision algorithms include a robust estimation step where model parameters are computed from a data set containing a significant proportion of outliers. The RANSAC al...
Jiri Matas, Ondrej Chum
ICCAD
2009
IEEE
117views Hardware» more  ICCAD 2009»
15 years 4 months ago
Binning optimization based on SSTA for transparently-latched circuits
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
Min Gong, Hai Zhou, Jun Tao, Xuan Zeng
KDD
2005
ACM
142views Data Mining» more  KDD 2005»
16 years 7 months ago
Towards exploratory test instance specific algorithms for high dimensional classification
In an interactive classification application, a user may find it more valuable to develop a diagnostic decision support method which can reveal significant classification behavior...
Charu C. Aggarwal