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ITC
2002
IEEE
114views Hardware» more  ITC 2002»
15 years 11 months ago
Scan Power Reduction Through Test Data Transition Frequency Analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
FORTE
2000
15 years 8 months ago
On Test Derivation from Partial Specifications
The paper addresses the problem of test derivation from partially defined specifications. A specification is modeled by an Input/Output FSM such that transitions from some states ...
Alexandre Petrenko, Nina Yevtushenko
ISICA
2007
Springer
16 years 28 days ago
Interplanetary Trajectory Optimization with Swing-Bys Using Evolutionary Multi-objective Optimization
Abstract. Interplanetary trajectory optimization studies mostly considered a single objective of minimizing travel time between two planets or launch velocity of spacecraft at the ...
Kalyanmoy Deb, Nikhil Padhye, Ganesh Neema
DAC
2008
ACM
16 years 7 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
171
Voted
VTS
2008
IEEE
104views Hardware» more  VTS 2008»
16 years 1 months ago
Signature Rollback - A Technique for Testing Robust Circuits
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
Uranmandakh Amgalan, Christian Hachmann, Sybille H...