8398 search results - page 377 / 1680 » Optimal Software Testing |
173
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
195
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VLSID
2005
IEEE
16 years 11 days ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
210
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ISQED
2002
IEEE
15 years 11 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
177
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VLSID
1993
IEEE
15 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
167
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CC
2004
Springer
16 years 5 days ago
2004
Springer
Although optimization technology has been successful over the past 40 years, recent trends are emerging that demand we reconsider the paradigm that we are using for code optimizati...