8398 search results - page 338 / 1680 » Optimal Software Testing |
195
Voted
FCT
2009
Springer
16 years 1 months ago
2009
Springer
Suppose that we are given a set of n elements d of which are “defective”. A group test can check for any subset, called a pool, whether it contains a defective. It is well know...
191
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ATAL
2005
Springer
16 years 8 days ago
2005
Springer
Software comprehension (understanding software structure and behavior) is essential for developing, maintaining, and improving software. This is particularly true of agent-based s...
171
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CEC
2005
IEEE
16 years 10 days ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
148
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GECCO
2004
Springer
16 years 3 days ago
2004
Springer
Fitness functions derived for certain white-box test goals can cause problems for Evolutionary Testing (ET), due to a lack of sufficient guidance to the required test data. Often t...
175
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VTS
1998
IEEE
15 years 11 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...