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VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
16 years 7 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
16 years 9 days ago
An Infrastructure to Functionally Test Designs Generated by Compilers Targeting FPGAs
This paper presents an infrastructure to test the functionality of the specific architectures output by a highlevel compiler targeting dynamically reconfigurable hardware. It resu...
Rui Rodrigues, João M. P. Cardoso
STVR
2002
88views more  STVR 2002»
15 years 6 months ago
Empirical studies of test-suite reduction
Test-suite reduction techniques attempt to reduce the costs of saving and reusing test cases during software maintenance by eliminating redundant test cases from test suites. A po...
Gregg Rothermel, Mary Jean Harrold, Jeffery von Ro...
SIGSOFT
1996
ACM
15 years 10 months ago
Abstracting Dependencies between Software Configuration Items
ing Dependencies between Software Configuration Items CARL A. GUNTER University of Pennsylvania icle studies an abstract model of dependencies between software configuration items ...
Carl A. Gunter
OOPSLA
2007
Springer
16 years 25 days ago
Improving quality together
One recent change in software development is developers starting to take responsibility for the quality of their work by writing and executing automated tests. As with any new act...
David G. Jones, Gordon R. Cameron