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ATS
2001
IEEE
137views Hardware» more  ATS 2001»
15 years 10 months ago
Compaction Schemes with Minimum Test Application Time
Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...
Ozgur Sinanoglu, Alex Orailoglu
ICCAD
2000
IEEE
171views Hardware» more  ICCAD 2000»
15 years 11 months ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb
ICML
2001
IEEE
16 years 7 months ago
Direct Policy Search using Paired Statistical Tests
Direct policy search is a practical way to solve reinforcement learning problems involving continuous state and action spaces. The goal becomes finding policy parameters that maxi...
Malcolm J. A. Strens, Andrew W. Moore
ICML
2007
IEEE
16 years 7 months ago
Discriminative learning for differing training and test distributions
We address classification problems for which the training instances are governed by a distribution that is allowed to differ arbitrarily from the test distribution--problems also ...
Michael Brückner, Steffen Bickel, Tobias Sche...
PASTE
2005
ACM
16 years 3 days ago
Representation-independent program analysis
Program analysis has many applications in software engineering and high-performance computation, such as program understanding, debugging, testing, reverse engineering, and optimi...
Michelle Mills Strout, John M. Mellor-Crummey, Pau...